Reorientation transition in NiO film

Continuous spin reorientation transition in epitaxial antiferromagnetic NiO thin films.
J. Li, E. Arenholz, Y. Meng, A. Tan, J. Park, E. Jin, H. Son, J. Wu, C. A. Jenkins, A. Scholl, H. W. Zhao, Chanyong Hwang, and Z. Q. Qiu
Phys. Rev. B 84, 012406 (2011)

(a) Schematic drawing of the measurement condition. (b) XAS from the Ni L2 edge and Fe magnetic hysteresis
loops from the Fe XMCD measurement. (c) L2 ratio versus the polarization angle. The result shows that the NiO in-plane spin component decreases to zero as the MgO thickness increases to 35 ML.